Impact of SAW Device Passivation on RF Performance

Burton W. Marks, Don W. Sheddrick, and Shen Jen

ABSTRACT Passivation layers consisting of sputtered Al2O3 have been deposited onto SAW devices for the purpose of reducing the incidence of shorts. A coupling-of-modes model was used with one-port resonators, coupled resonator filters (CRF), and test structures. The passivation layer stiffens the surface with a velocity increase proportional to t/λ, where t is the passivation layer thickness. Attenuation is increased slightly, producing a 0.25-dB increase in the loss of a one-port resonator at 314 MHz. The effect on reflectivity is minimal and of much lesser importance to the designer.

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