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Michael M. Driscoll |
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Northrop Grumman Corporation |
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Electronic Sensors and Systems Division |
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Baltimore, Maryland |
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2000 IEEE Frequency Control Symposium |
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Kansas City, MO - June 6, 2000 |
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1. Short-Term Frequency/Phase/Amplitude
Stability |
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2. Basic Oscillator Operation |
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3. Types of Resonators and Delay Lines |
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4. Useful Network/Impedance Transformations |
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5. Sustaining Stage Design and Performance |
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6. Oscillator Frequency Adjustment/Voltage
Tuning |
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7. Environmental Stress Effects |
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8. Oscillator Circuit Simulation & Noise
Modeling |
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9. Oscillator Noise De-correlation/Noise
Reduction Techniques |
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10. Oscillator Test/Troubleshooting |
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11. Summary |
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12. List of References |
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Types of automatic level control (ALC) and/or
automatic gain control (AGC): |
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(1) Instantaneous signal amplitude limiting/waveform clipping via
sustaining stage |
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amplifier gain compression or separate diode waveform clipping.* |
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(2) Gain reduction using a feedback control loop. The oscillator RF signal is DC- |
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detected, and the amplified detector output fed to a variable gain
control element |
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(i.e., PIN attenuator) in the oscillator. |
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* Symmetrical diode waveform clipping provides
better (harder) limiting, compared to single-ended clipping, and appears to
provide more immunity from the effects of diode noise. The least noisy form of transistor
amplifier gain compression is single-ended current limiting, rather than
voltage limiting (saturation).
Single-ended limiting is soft limiting. |
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Oscillation is initiated by spectral components
of circuit noise and/or DC turn-on transients occurring at the frequency
where the small signal conditions for oscillation are satisfied. |
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Turn-on time is determined by the initial
noise/transient spectral signal level, the steady-state signal level, the
oscillator loop (resonator loaded Q) delay, and the small signal excess
gain. |
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High group delay (high resonator loaded Q) |
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High operating frequency |
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Low Loss |
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Moderate Drive Capability |
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Low frequency sensitivity to environmental
stress (vibration, temperature, etc.) |
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Good short-term and long-term frequency
stability |
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Accurate frequency set-on capability |
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External frequency tuning capability |
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No undesired resonant modes or higher loss in
undesired resonant modes or undesired resonant mode frequencies far from
desired operating frequency |
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High manufacturing yield of acceptable devices |
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4.
Dielectric |
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5. Cavity,
Waveguide |
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6.
Optical Fiber |
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7. Whispering Gallery Mode, Sapphire Dielectric |
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Desirable Properties |
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Very high Q. |
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Controllable (selectable) frequency temperature
coefficient. |
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Excellent long-term and short-term frequency
stability. |
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Relatively low cost. |
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Moderately small volume (especially SAW, STW). |
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Well defined, mature technology. |
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Undesirable Properties |
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1/f FM noise that often exceed effects of
sustaining stage 1/f PM noise. |
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Unit-to-unit 1/f FM noise level. variation; high
cost associated with low yield of very low noise resonators. |
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BAW resonator drive level limitations: 1-2mW for
AT-cut, 5-7mW for SC-cut, even
lower drive for low drift/aging. |
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Non-uniform vibration sensitivity. |
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FOM (loaded Q) decreases with increasing
frequency. |
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Very popular in wireless hardware |
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High drive capability |
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One piece, plated construction results in low
vibration sensitivity |
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Unloaded Q is only moderate (proportional to
volume) |
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L(100Hz)=-100dBc/Hz,
with -178dBc/Hz noise floor achieved at 640MHz using large volume
resonators as multi-pole filter oscillator stabilization elements |
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Even though resonators are “passive”, excess 1/f noise has been measured in
large volume, high delay devices with variations in 1/f noise level of up
to 20dB |
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Advantages |
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High Q at high (microwave) frequency |
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No measurable resonator 1/f noise |
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High drive capability |
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Near-zero temperature coefficient for some
ceramic dielectric materials |
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Amenable to mechanical adjustment and electronic
frequency tuning |
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Disadvantages |
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Substantial Q degradation unless cavity volume
is large compared to that of dielectric (low order mode resonances) |
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Highest Q with modest volume occurs above C-band
where sustaining stage amplifiers are primarily GaAs sustaining stage
amplifiers exhibiting relatively high 1/f AM and PM noise |
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Resonator frequency sensitivity to vibration is
typically 10 to 100 times higher, compared to BAW, SAW resonators |
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Dielectric loss in sapphire is low at room
temperature and rapidly decreases with decreasing temperature. |
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High-order “whispering gallery” mode ring and
solid cylindrical resonators have been built that exhibit unloaded Q
values, at X-band, of 200,000 at room temperature and 5 to 10million at
80K. |
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The ultra-high Q exhibited by these resonators
has enabled oscillators to be designed and constructed whose X-band output
signal spectra are significantly superior, in both a near-carrier noise and
noise floor basis, to that attainable using any other resonator technology. |
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Impedance inversion/transformation (can
transform a resonator series-resonance impedance to a parallel resonance) |
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Relatively broadband impedance transformation,
compared to band-pass structures (lower sensitivity to element value
tolerance, temperature coefficient, etc.) |
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All or some of the line can be realized using
actual transmission line (coaxial cable) |
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- Thermal isolation of ovenized components |
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- Vibration isolation of acceleration
sensitive components |
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At HF and Low VHF, transmission line
transformers can be realized with values for characteristic impedance not
obtainable using conventional coaxial or twin lead cable. |
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Positive or negative phase shifts may be
obtained using high-pass or low-pass lumped element approximations |
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Normally, capacitors are used for the reactances
X1 and X2. |
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At microwave frequencies, transistor junction
capacitance may comprise a significant part or all of the reactance. |
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Use un-bypassed emitter resistance (a resistor
or the resonator itself connected in series with the emitter and operated
at series-resonance |
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Use high frequency transistors having small
junction capacitance and operate at moderately high collector-base bias
voltage to reduce signal phase modulation due to junction capacitance noise
modulation* |
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Use heavily bypassed DC bias circuitry and
regulated DC supplies* |
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Consider the use of a base-band noise reduction
feedback loop* |
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Extract the signal through the resonator to the
load, thereby using the resonator transmission response selectivity to
filter the carrier noise spectrum |
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* From the NIST Tutorial on 1/f AM and PM Noise
in Amplifiers |
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Advantages |
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Low Cost |
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Pre-fabrication and post-fabrication design and
design change flexibility |
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Biasing flexibility |
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Efficiency (DC power consumption) |
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Disadvantages |
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For low noise, transistors with high ft should
be used; circuit is then susceptible to high frequency instability due to
layout parasitics and loss-less resonator out-of-band impedance |
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Difficulty in predicting or measuring 1/f AM and
PM noise using 50 ohm test equipment since actual sustaining
stage-to-resonator circuit interface impedances are not usually 50 ohms. |
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Advantages |
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Easily characterized using 50 ohm test
equipment, including measurement of amplifier s-parameters, 1/f AM , 1/f
PM, and KTBF noise both for linear and at gain-compression operating
points. |
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Availability of unconditionally stable
amplifiers eliminates possibility of parasitic oscillations. |
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Amplifiers available (especially silicon bipolar
and GaAs HBT types) exhibiting low 1/f AM and PM noise. |
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Certain models maintain low noise performance
when operated in gain compression thereby eliminating a requirement for
separate ALC/AGC circuitry in the oscillator. |
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Amplifier use allows a building block approach
to be used for all of the oscillator functional sub-circuits: amplifier,
resonator, resonator tuning, resonator mode selection filter, etc. |
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Relatively low cost amplifiers (plastic, COTS,
HBT darlington pair configuration) are now available with multi-decade
bandwidths operating from HF to microwave frequencies. Some types include means for setting
bias current (therefore compression point). |
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In general, amplifier vendors do not design for,
specify, or measure device 1/f AM and PM noise. |
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It is usually necessary to evaluate candidate
sustaining stage amplifiers in terms of measured 1/f AM and PM noise at
intended drive level (i.e., in gain compression when the oscillator will
not employ separate ALC/AGC). |
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Amplifier S21 phase angle sensitivity to gain
compression, as well as gain magnitude and phase sensitivity to DC supply
variation (noise) must be considered. |
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Silicon bipolar amplifiers and HBT amplifiers
operating below L-band normally exhibit lower levels of 1/f AM and PM
noise, compared to microwave amplifiers. |
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Reactance tuning |
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Carrier signal is maintained at center of the
transmission response of the resonator-reactance combination |
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Impedance transformation is often required
between the resonator and the tuning circuit |
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Phase Shift Tuning |
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Carrier signal moves within the resonator
transmission response pass-band; tuning range is restricted to less than
the passband width |
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Phase shift circuit can be implemented as a 50
ohm device |
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For electronic (voltage) tuning, the placement
of the phase shift tuning circuit in the oscillator effects the sideband
response of the oscillator, and must be taken into account in phase-locked
oscillator applications. |
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A resonator operated at/near series resonance
exhibits a near-linear reactance vs frequency characteristic. |
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Connection of a linear reactance vs voltage
network in series with the resonator will then result in a circuit whose
overall resonant frequency vs voltage characteristic is near -linear. |
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The same holds true for a parallel connection of
a parallel resonant resonator and a linear susceptance vs voltage circuit. |
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Impedance transformation between the resonator
anf the tuning circuit is often required to increase tuning range using
practical value components in the tuning circuit. |
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Use of back-to-back varactor diodes in the
tuning circuits has been found to eliminate effects of tuning circuit diode
noise n oscillator signal spectral performance. The effects of Johnson noise and 1/f noise in large value
resistors in the tuning circuit can result in oscillator signal spectral
degradation. |
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For near-linear reactance vs voltage using
abrupt junction varactor diodes [Cv = K/(v+f)1/2], |
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1/(LpCvo) = wo2/3 where Cvo is
the varactor diode capacitance at the band center voltage = Vo |
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For zero reactance at the band center tuning
voltage, Ls=Lp/2 |
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Resonator/Oscillator signal frequency change can
be induced by changes in: |
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Temperature Pressure |
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Acceleration (vibration) Other
(radiation, etc) |
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Vibration constitutes the primary environmental
stress affecting oscillator signal short
-term frequency stability (phase noise). |
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Although resonator sensitivity to vibration is
often the primary contributor, vibration -induced changes in the non-resonator portion of the
oscillator circuit can be significant. |
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High Q mechanical resonances in the resonator
and/or non-resonator oscillator circuitry and enclosure can cause severe
signal spectral degradation under vibration. |
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A signal can be generated using low noise, 100MHz
crystal oscillator technology exhibiting a phase noise sideband level at 1KHz
carrier offset frequency of -163dBc/Hz. |
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The corresponding fractional frequency
instability is Sy(f=100Hz) = 1X10-26/Hz. |
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The corresponding phase instability is 1X10-16
rad2/Hz. |
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The corresponding crystal vibration level that
would degrade the at-rest oscillator signal spectrum, based on 5X10-10/g
crystal vibration sensitivity is: 4X10-8 g2/Hz. |
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The corresponding allowable signal path
dimensional change, based on a wavelength of 300cm is: 4.8X10-7
cm or 48 angstroms/Hz1/2. |
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In the oscillator circuit, where the nodal
impedance level is 25ohms (RG=RL=50 ohms), a capacitance variation (due to
vibration-induced printed board or enclosure cover movement) of: 6X10-7
pF/Hz1/2 would degrade the at-rest signal spectrum. |
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Entire oscillator or resonator alone can be
mounted on a shaker for determination of vibration sensitivity. |
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Resonator vibration sensitivity measurements can
be made with the resonator connected to the oscillator sustaining stage or
connected in a passive phase bridge. |
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For passive bridge measurements, the resonator
can be connected as a one port device and connected to the bridge via a
single (odd number of quarter-wavelengths) piece of coaxial cable. |
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In either measurement method, the effects of
coaxial cable vibration must be taken into account, especially for
measurement of devices having very small values of vibration sensitivity. |
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The effects of cable vibration can be determined
by re-orienting the DUT on the shake table 180 degrees while not
re-orienting the connecting coaxial cable and measuring the relative change
in the magnitude and phase of the recovered, vibration-induced carrier
signal sideband, relative to that of the shake table accelerometer. |
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Test Results for 40MHz Oscillator Sustaining
Stage and Coaxial Cables |
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(vibration-induced phase shift increases with
carrier frequency) |
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Small signal analysis is useful for simulating
linear (start-up) conditions. |
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Simulation of steady-state condition s possible
if/when large signal (i.e., in-compression) device s-parameters or ALC
diode steady-state impedance values are known. |
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Two port analysis is most appropriate for
oscillator circuits employing modular amplifier sustaining stages. Open loop simulation in a 50 ohm system
is valid for simulation of closed loop performance only when the loop is
“broken” at a point where either the generator or load impedance is 50 ohms
(i.e., at the amplifier input or output if the amplifier has good input or
output VSWR). |
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One port (negative resistance generator)
analysis is useful when simulating discrete oscillators employing
transistor sustaining stage circuitry. |
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Circuit analysis/simulation should include
component parasitic reactance (inductor distributed capacitance and loss,
component lead inductance, etc).
For circuits operating at and above VHF, printed board/substrate
artwork (printed tracks, etc) should also be included in the circuit model. |
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Cx and Cy values optimized to provide Zin = -70
+ j0 at 100MHz |
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Zin calculated from 50MHz to 1GHz to insure
negative resistance is only generated over a small band centered at 100MHz
(note use of Rc) |
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Large signal condition (where the negative
resistance portion of Zin drops to 50 ohms = crystal resistance) simulated
by reducing the ALC impedance value. |
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Note that the sustaining stage input impedance
optimized to exactly -70 + j0 ohms |
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Real part of input impedance is negative from
approx. 91MHz 108MHz |
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Output signal near-carrier (1/f FM) noise
primarily determined by crystal self noise |
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TP1-to-TP2 voltage is maximized via trimmer
capacitor adjustment. The voltage
level (at maximum) is a measure (verification) of requisite loop excess
gain. |
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Within the Oscillator Circuit |
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Use the resonator impedance or transmission
response selectivity to reduce noise (i.e., extract the signal though the
resonator to the load). |
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Use multiple, parallel sustaining stage
amplifiers (amplifier 1/1 PM noise de-correlation) |
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Use multiple, series connected resonators
(resonator 1/f FM noise de-correlation) |
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Use multiple resonators in an isolated cascade
or multi-pole filter configuration (increased loop group delay) |
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Consider sustaining stage amplifier noise
reduction via: (1) noise detection and base-band noise feedback (to phase
and amplitude modulators) or (2) feed-forward noise cancellation |
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External to the Oscillator Circuit |
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External active (phase-locked VCO) or passive,
narrow-band spectral cleanup filters |
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Overall subsystem noise reduction via feedback
or feed-forward noise reduction techniques |
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Measure one-port negative resistance vs
frequency using ANA s11 measurements (may need to use a series build-out
resistor to keep the sustaining stage from oscillating). |
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For the closed loop (oscillating circuit),
measure the circuit nodal voltage amplitude and relative phase and view the
amplitude waveforms to estimate the degree of limiting (excess gain) using
a vector voltmeter or similar test equipment. |
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If the circuit does not oscillate, break open
the oscillator loop where accurate duplication of source and load
impedances is not critical (i.e., where ZS is much smaller than
ZL and drive the circuit with an external generator to determine
‘faulty’ portion of the circuit from phase and amplitude measurements made
along the signal path. |
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As necessary, make circuit modifications to
achieve desired circuit open loop phase and gain characteristics. |
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In-circuit resonator effective Q can be
determined by intentionally altering the circuit phase shift by a known
amount and measuring the resultant oscillator signal frequency shift. |
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Determine the oscillator/resonator
technology best suited for the application |
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- Operating frequency - Unloaded
Q - Drive level |
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- Short-term stability -
Environmental stress sensitivity |
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Determine the optimum sustaining stage
design to be used |
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- Discrete transistor - Modular
amplifier |
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Silicon bipolar, GaAs, HBT, etc - ALC, AGC, or amplifier |
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gain compression |
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Determine if use of noise reduction techniques,
including multiple device use, noise feedback, feed-forward noise
cancellation, vibration isolation, etc is needed |
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Improvements in resonator performance |
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- New resonator types having higher Q,
higher drive capability, higher frequency, |
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smaller volume, better short-term stability, and lower vibration
sensitivity |
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Microwave (sustaining stage)
transistors/amplifiers with lower levels of 1/f AM and PM noise |
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- New semiconductor designs, materials,
processing |
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- Circuit noise reduction schemes (feedback,
etc) |
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Improved vibration sensitivity reduction schemes |
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- Cancellation, feedback control, mechanical
isolation, etc |
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