2002 Technical Program Committee
IEEE Int'l Frequency Control Symposium

Technical Program Committee Chair: John R. Vig
J.Vig@ieee.org

Group 1 Vice- Chair: Gary Johnson
g.johnson@ieee.org
Fundamental Properties of Materials, Theory and Design of Resonators and Filters

Group 2 Vice- Chair: Gary Montress
Gary_K_Montress@res.raytheon.com
Oscillators - BAW and SAW, Microwave to Optical, Synthesizers and Other Circuitry

Group 3 Vice- Chair: Chris Ekstrom
ekstrom@atom.usno.navy.mil
Atomic Frequency Standards, Frequency and Time Coordination, Optical Frequency Standards

Group 4 Vice- Chair: Ryszard Lec
r.lec@coe.drexel.edu
Resonant Chemical & Biological Sensors, Resonant Physical Sensors, BAW, SAW Sensors

Group 5 Vice- Chair: Butch Tysinger
butch_tysinger@agilent.com
Manufacturing Technology

Technical Program Committee Members

Charles Adams Agilent-Technologies, USA Ivan Avramov Institute of Solid State Physics, BULGARIA Arthur Ballato U.S. Army CECOM RDEC Ewald Benes Technische Universität Wien, AUSTRIA Martin Bloch Frequency Electronics Inc., USA Jean-Simon Boulangerr National Research Council of Canada Canon Bradley USA Remi Brendel ENSMM, FRANCE Eric Burt Jet Propulsion Laboratory, USA Stephen Cantor MITRE Corp., USA Shih S. Chuang Statek Corp., USA Leonard Cutler Agilent Laboratories, USA Andrea DeMarchi Politecnico di Torino, ITALY Michael Driscoll Northrop Grumman Corp., USA Bernard Dulmet Ecole Nationale Superieure de Mécanique et des Microtechniques, FRANCE Errol Eernisse Quartzdyne, Inc., USA Christopher Ekstrom U.S. Naval Observatory Jeremy K.A. Everard University of York, UNITED KINGDOM Eva S. Ferre-Pikal University of Wyoming, USA Raymond Filler US Army CECOM RDEC Peter Fisk National Measurement Laboratory, CSIRO, Physics, AUSTRALIA Marvin Frerking Innovative Technology Products, USA Michael Garvey Datum, Beverly, USA George J. Giansanti, Jr. Micro Networks, Corp. (Andersen Labs), , USA William P. Hanson USA Ken-ya Hashimoto Chiba University, JAPAN Jackie Hines J.H. Hines Consulting, USA Bernardo Jaduszliwer The Aerospace Corporation, USA Steven Jefferts NIST, USA Gary Johnson Sawyer Research Products, USA Fabien J. Josse Marquette University, USA Vladimir A. Klipov Sawyer Research Products, USA Alvin Kong TRW, USA Shigeru Kurosawa National Institute of Advanced Industrial Science and Technology (AIST), JAPAN Jack Kusters Agilent Technologies, USA Ryszard Lec Drexel University, USA Ralf Lucklum Otto-von-Guericke-Univ., GERMANY

Lute Maleki Jet Propulsion Laboratory, USA Donald Malocha University of Central Florida, USA George Mansfeld Institute of Radioengineering and Electronics RAS, RUSSIA Eishi Momosaki Epson R&D, Inc., JAPAN Gary Montress Raytheon Research Division, USA David Morgan Impulse Consulting, UNITED KINGDOM Bernd Neubig GERMANY Shin-ichi Ohshima National Metrology Institute of Japan (NMIJ) Thomas Parker NIST, USA Guy Portnoff Quartz Pro AB, SWEDEN John Prestage Jet Propulsion Lab., USA Leo Reindl Institut für Elektrische Informationstechnik, GERMANY Victor Reinhardt Boeing Space Systems, USA Enrico Rubiola ESSTIN - LPMI - Universite Henri Poincare, FRANCE Clemens Ruppel EPCOS AG, GERMANY Jesse H Searls Poseidon Scientific Instruments, AUSTRALIA Marco Siccardi Datum, USA Robert Smythe Piezo Technology Inc., USA Samuel Stein Timing Solutions Corp., USA Dan Stevens Vectron International, USA Donald Sullivan NIST, USA Pierre Thomann Observatoire Cantonal, SWITZERLAND Robert Tjoelker Jet Propulsion Laboratory, USA Michael Tobar The University of Western Australia Dmitry Tsarapkin MPEI, RUSSIA. Butch Tysinger Agilent Technologies, USA : John Vig U.S. Army Communications-Electronics Command Yakov L. Vorokhovsky Morion, RUSSIA Fred Walls NIST, USA Warren Walls Femtosecond Systems, Inc. , USA Yasuaki Watanabe Tokyo Metropolitan University, JAPAN Eric T. Watts Boeing Satellite Systems, USA Joseph White U.S. Naval Research Laboratory Debra Coler Technical Program Committee Administrator Oewaves, Inc. , USA Barbara McGivney Conference Coordinator Synergistic Mgt. Inc., USA