Comparison of Lumped-Element and Transmission-Line Models for Thickness-Shear-Mode Quartz Resonator Sensors

Richard W. Cernosek, Stephen J. Martin, A. Robert Hillman, and Helen L. Bandey

Abstract Both a transmission-line model and its simpler variant, a lumped-element model, can be used to predict the responses of a thickness-shear-mode quartz resonator sensor. Relative deviations in the parameters computed by the two models (shifts in resonant frequency and motional resistance) do not exceed 3% for most practical sensor configurations operating at the fundamental resonance. If the ratio of the load surface mechanical impedance to the quartz shear characteristic impedance does not exceed 0.1, the lumped-element model always predicts responses within 1% of those for the transmission-line model.

1998 IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control 45:1399-1407

© 1998, by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved.

Back to Table of Contents