ABSTRACT Line-focus acoustic microscopy has been used to measure the phase velocities of surface acoustic waves on bare MgO and bare LaAlO3, and on Nb2O5/MgO and BaTiO3/LaAlO3 thin-film/substrate configurations. The thin films are polycrystalline materials. The substrates are anisotropic single-crystals. The measured angular variation of the surface acoustic wave velocities has been used to determine the elastic constants of MgO substrate and Nb2O5 thin-film. It has been assumed that the Nb2O5 films may be considered as essentially isotropic. The measurements for LaAlO3 and BaTiO3/LaAlO3 show anomalies which are attributed to twinning in the LaAlO3 substrate.
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