Measurement of Longitudinal Piezoelectric Coefficient of Thin Films by a Laser-Scanning Vibrometer

Kui Yao and Francis Eng Hock Tay

ABSTRACT A laser scanning vibrometer (LSV) was used for the first time to measure the piezoelectric coefficient of ferroelectric thin films based on the converse piezoelectric effect. The significant advantages of the use of the LSV for this purpose were demonstrated. Several key points were discussed in order to achieve reliable and accurate results.

© 2003, by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved.

Back To Table of Contents