11th Quartz Devices Conference & Exhibition Vol. 1
X-Ray Fluorescent Thickness Measurement for SPC (Statistical Process Control) of Films on Quartz
- Michael Brodsly
Field-Assisted Bonding of Single Crystal Quartz
- Randall D. Watkins, Clinton D. Tuthill, Richard M. Curlee, Dale R. Koehler, and Charles F. Joerg
High Reliability Crystal Devices Planning for Development and Manufacture
- Thryqve R. Meeker
Linear Steady State Oscillator Analysis in the Immittance Domain
- Benjamin Parzen
Precision Temperature Test Station for Quartz Crystals
- Robert Kinsman and Donald Ryback
Automated Measurement System for Final Frequency Plating and Characterization of High Precision SC-Cut Crystals
- Pierre Stoermer and John A. Kusters
Realization Of High Degree Delay Equalizers For Crystal Bandpass Filters
- Philip R. Geffe
A Very Fast Orientation Determination Of Doubly Rotated Quartz Cuts
- H. Merigoux, J. F. Darces
Measurement of Quartz Crystal Units up to 500 Mhz and Above by the Use of a Pi Network with Error Correction
- Bernd W. Neubig
Quartz Crystal Resonator Model Parameter Sensitivity, a First Order Analysis
- Donald C. Malocha, Madjid A. Belkerdid, & Karen M. Park
Abrasive Selection and Control in Lapping Processes
- Gerald L. Simmons
Summary Report of EIA-PI1 Participation in IEC-TC49-WG6 Measurements Workshop and Activities of the IEC-TC49
- Charles Adams and Canon Bradley
Summary Report of Working Group 6 [Measurements] Activities During the TC/49 Meeting in Brighton, England
- Warren L.Smith
The Philips Digital Temperature-Compensated Quartz Oscillator
- Joe Yerna
Steady State Oscillator Analysis in the Immittance Domain (Part 2 Applications Including Computer Aided Analysis)
- Benjamin Parzen
The Influence of Design Parameters on the Dynamic Capacitance of Quartz Crystal Units
- Vladimir Brajović
Generating Surface Figure and Finish on Quartz - Part 2
- John H Sherman, Jr.
Improving Productivity with Manufacturing Cycle Time Reduction
- James B. Swartz
Improving Competitiveness of American Industry
11th Quartz Devices Conference & Exhibition Vol. 2
Committees, Exhibitors, and Sponsors
Computer-Aided Failure Analysis for Wide-Band Crystal Filters
- Jenn-Yah Su
Why Publish?
- John H. Sherman. Jr.
Influence of Stray Reactance on Measured Crystal Parameters
- Warren Smith
OSHA: Impact on the Electronics Industry
- Cynthia E. Dearing
Technological Vulnerability
- Martin J. Kiousis
Future Piezoelectric Device Requirements for Radio Communications Equipment
- Robert Kinsman
The Future of Piezoelectric Applications in Telecommunications
- Earle E. Simpson
Quartz Usage Trends in Computers & Instruments
- Donald L. Hammond
Quartz Usage Trends in Computers & Instruments
- Donald L. Hammond