10th Quartz Devices Conference & Exhibition Vol. 1
Welcome
- Howard W. Wolk
New Technology for Detection and Removal of Surface Contamination Involving Particulates or Water/Organic Materials
- S. A. Hoenig
Micro Grit WCA Manufacture and Use
- Michael Kolendo
Generating Surface Figure and Finish on Quartz - Part 1
- John B. Sherman, Jr.
Requirements for MIL-0-55310B Crystal Oscillators and Qualification to MIL-STD-1772
- Janice Scherer
Glass-fo-Metal Seals for Crystal Base Applications
- J. Pokrzyk
Comparison of Lithograph and Aperture Masking Techniques
- Thomas Payne and M. Alsup
Final Report, EIA-P11 Round Robin Crystal Measurement Experiment
- Warren L. Smith
Quartz Resonator Model Measurement and Sensitivity Study
- Donald Malocha
Technique for Measuring the Acceleration Sensitivity of Quartz Resonators
- Milton H. Watts, Errol P. EerHisse, Roger W. Ward, and Robert B. Wiggins
S-Parameter Measurements of High Frequency Resonators
- Tim Semones
Digitally Compensated Crystal Oscillator (DCXO)
- Carl Erikson and Hoklay Pak
Effect of Radiation on the Acoustic Loss and Frequency Offsets in Quartz Crystals
- J. J. Martin
EIA Specification RS-477 for Cultured Quartz Material, Updated
- Baldwin Sawyer
Statistical Process Control (SPC) and Design of Experiments
- Keki Bhote
Design of World Class Operations
- James B. Swartz
10th Quartz Devices Conference & Exhibition Vol. 2
The Synthesis of High Aluminum Quartz
- Jonathan W. Foise and Gary R. Johnson
Quartz Resonator Model Measurement and Sensitivity Study
- D. C. Malocha, H. Ng, and M. Fletcher
Measurements of High Frequency Crystals Using the EIA-512 Measurement Standard
- Kirk Anderson
Digitally Compensated Crystal Oscillator (DCXO)
- Hoklay Pak
Miniature Oscillator Design
- K. Schwaller, K. Schulthess and W. Zingg
Effect of Radiation on the Acoustic Loss and Frequency Offsets in Quartz Crystals
- J. J. Martin
Quality in Cultured Quartz for Resonator Applications
- Baldwin Sawyer
Design of Experiments - Easier, Less Costly, More Powerful than SPC
- Keki R. Bhote